A Cephalometric Landmark Regression Method based on Dual-encoder for High-resolution X-ray Image

Accurate detection of cephalometric landmarks is crucial for orthodontic diagnosis and treatment planning. Current methods rely on a cascading form of multiple models to achieve higher accuracy, which greatly complicates both training and deployment processes. In this paper, we introduce a novel regression paradigm capable of simultaneously detecting all cephalometric landmarks in high-resolution X-ray images. Our approach only utilizes the encoder module from the transformer to design a dual-encoder architecture, enabling precise detection of cephalometric landmark positions from coarse to fine. Specifically, the entire model architecture comprises three main components: a feature extractor module, a reference encoder module, and a finetune encoder module. These components are respectively responsible for feature extraction and fusion for X-ray images, coarse localization of cephalometric landmark, and fine-tuning of cephalometric landmark positioning. Notably, our framework is fully end-to-end differentiable and innately learns to exploit the interdependencies among cephalometric landmarks. Experiments demonstrate that our method significantly surpasses the current state-of-the-art methods in Mean Radical Error (MRE) and the 2mm Success Detection Rate (SDR) metrics, while also reducing computational resource consumption. Our code will be available soon.